Semiconductor Materials and Device Characterization   [Archived Catalog]
2018-2019 Undergraduate Studies Bulletin
   

ELCT 574 - Semiconductor Materials and Device Characterization

Credits: 3

Semiconductor material and device characterization; resistivity, carrier and doping density, contact resistance, Schottky barriers, series resistance, defects, trapped charges, and carrier lifetime.

Prerequisites: ELCT 363 or equivalent