Advanced Semiconductor Characterization   [Archived Catalog]
2016-2017 Graduate Studies Bulletin (Archived Copy)
   
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ELCT 774 - Advanced Semiconductor Characterization

Credits: 3

Advanced semiconductor material characterization; Hall effect and mobility measurements, optical characterization, scanning probe microscopy, electron microscopy, X-Ray diffraction techniques; nanoscale characterization techniques.

Prerequisites: ELCT 574



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